School of Chemical Engineering
|TRAINING||Training is required to use this item and we can arrange this if needed.|
|PRIMARY CONTACT||James Bowen (AWM Facilities Manager)|
|SECONDARY CONTACT||Michael Adams (Lead PI)|
|ORGANISATION||University of Birmingham|
Atomic force microscope capable of imaging in air and fluid, as well as making electrical measurements. Large scope of samples may be studied such as nanoparticles, electrode surfaces, thin films and biological samples.
Last Updated: 24th April, 2013
- Materials characterisation/Surface probe microscopy/Atomic Force
This M5 equipment data is licensed under the UK Open Government Licence.