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Focused Ion Beam (FIB) Equipment

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MANUFACTURER FEI
MODEL DB235 STRATA
ACRONYM FIB

School of Mechanical Engineering

AVAILABILITY Available through booking
TRAINING Training is required to use this item and we can arrange this if needed.
PRIMARY CONTACT Kyle Jiang
SECONDARY CONTACT Mike Ward
ORGANISATION University of Birmingham

Description

The Dualbeam Strata 235 combined focused ion beam and scanning electron microscope

Last Updated: 24th April, 2013

University of Birmingham

This M5 equipment data is licensed under the UK Open Government Licence.