Search our equipment.

Scanning Electron Microscope

Enquire Now
MANUFACTURER FEI XL30 SFEG
MODEL PW6633/07

School of Physics and Astronomy

PRIMARY CONTACT Richard Palmer
ORGANISATION University of Birmingham

Description

Electron beam looking at nanoscopic features of conductive materials/samples Purchased as part of the ERDF funded Creating and Characterisating Next Generation of Advanced Materials Project the Low Temperature Scanning Tunnelling Microscope can image and probe individual atoms. This allows electronic and vibrational spectroscopy with atomic-scale spatial resolution. They can also image larger areas of surfaces (~ 2 mm2) still with high spatial resolution. Possible applications range from probing the fundamentals of surface induced catalysis to arranging individual atoms in pre-designed structures, e.g., writing words and letters using individual atoms.

Last Updated: 24th April, 2013

University of Birmingham

This M5 equipment data is licensed under the UK Open Government Licence.