School of Physics and Astronomy
|PRIMARY CONTACT||Richard Palmer|
|ORGANISATION||University of Birmingham|
Structural/elemental/electronic atomic scale characterisation of nanoscale cluster/materials Purchased as part of the ERDF funded Creating and Characterisating Next Generation of Advanced Materials Project the JEOL Aberration-Corrected Transmission Electron Microscope (JEM-2100F) High resolution imaging, Materials qualification, Chemical analysis, Particles detection/characterisation, Defects analysis, Microstructural characterisation.
Last Updated: 24th April, 2013
- Materials Characterisation
This M5 equipment data is licensed under the UK Open Government Licence.