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JEM - 2100F Electron Microscope

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MANUFACTURER JEM
MODEL 2100F
ACRONYM Aberrated TEM

School of Physics and Astronomy

PRIMARY CONTACT Richard Palmer
ORGANISATION University of Birmingham

Description

Structural/elemental/electronic atomic scale characterisation of nanoscale cluster/materials Purchased as part of the ERDF funded Creating and Characterisating Next Generation of Advanced Materials Project the JEOL Aberration-Corrected Transmission Electron Microscope (JEM-2100F) High resolution imaging, Materials qualification, Chemical analysis, Particles detection/characterisation, Defects analysis, Microstructural characterisation.

Last Updated: 24th April, 2013

University of Birmingham

This M5 equipment data is licensed under the UK Open Government Licence.